A54SX32 |
RFQ for A54SX32 |
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| Product | Manufacturers | Pack | D/C |
| A54SX32 | - | BGA | - |
Actel's RadTolerant (RT) and HiRel versions of the SX Family of FPGAs offer all of these advantages for applications such as commercial and military satellites, deep space probes, and all types of military and high reliability equipment.
The RT and HiRel versions are fully pin compatible allowing designs to migrate across different applications that may or may not have radiation requirements. Also, the HiRel devices can be used as a low cost prototyping tool for RT designs.
The programmable architecture of these devices offer high performance, design flexibility, and fast and inexpensive prototyping-all without the expense of test vectors, NRE charges, long lead times, and schedule and cost penalties for design modifications that are required by ASIC devices.
Features |
| RadTolerant 54SX Fami ly• Tested Total Ionizing Dose (TID) Survivability Level• Radiation Performance to 100Krads (Si) (ICC Standby Parametric)• Devices Available from Tested Pedigreed Lots• Up to 160 MHz On-Chip Performance• Offered as Class B and E-Flow (Actel Space Level Flow)• QMl Certified Devices HiRel 54SX Fami ly• Fastest HiRel FPGA Family Available• Up to 240 MHz On-Chip Performance• Low Cost Prototyping Vehicle for RadTolerant Devices• Offered as Commercial or Military Temperature Tested and Class B• Cost Effective QML MIL-Temp Plastic Packaging Options• Standard Hermetic Packaging Offerings• QML Certified DevicesHigh Density Devices• 16,000 and 32,000 Available Logic Gates• Up to 228 User I/Os• Up to 1,080 Dedicated Flip-FlopsEasy Logic Integration• Non-Volatile, User Programmable• Highly Predictable Performance with 100% Automatic Place and Route• 100% Resource Utilization with 100% Pin Locking• Mixed Voltage Support-3.3V Operation with 5.0V Input Tolerance for Low Power Operation• JTAG Boundary Scan Testing in Compliance with IEEE Standard 1149.1• Secure Programming Technology Prevents Reverse Engineering and Design Theft• Permanently Programmed for Operation on Power-Up• Unique In-System Diagnostic and Debug Facility with Silicon Explorer• Supported by Actel's Designer Series and DeskTOP Series Development Systems with Automatic Timing Driven Place and Route• Predictable, Reliable, and Permanent Antifuse Technology Performance |
|
Symbol |
Parameter |
Limits |
Units |
|
VCCR |
DC Supply Voltage |
0.3 to +6.0 |
V |
|
VCCA |
DC Supply Voltage |
0.3 to +4.0 |
V |
|
VCCI |
DC Supply Voltage |
0.3 to +4.0 |
V |
|
VI |
Input Voltage |
0.5 to +5.5 |
V |
|
VO |
Output Voltage |
0.5 to +3.6 |
V |
|
IIO |
I/O Source Sink Current2 |
30 to +5.0 |
mA |
|
TSTG |
Storage Temperature |
40 to +125 |
°C |
Notes:
1. Stresses beyond those listed in the Absolute Maximum Ratings table may cause permanent damage to the device. Exposure to absolute maximum rated conditions for extended periods may affect device reliability. Device should not be operated outside the Recommended Operating Conditions.
2. The I/O source sink numbers refer to tristated inputs and outputs